GIANCARLO LA PENNA

PhD Graduate

PhD program:: XXXVI


supervisor: Marco Rossi
co-supervisor: Daniele Passeri

Thesis title: Non-destructive techniques for strain characterization and failure analysis in microelectronic devices down to the nanoscale: spotlight on Tip-Enhanced Raman Spectroscopy (TERS)

The semiconductor industry is undergoing a period of transformation, driven by the relentless pursuit of miniaturization. This downsizing trend, while advancing information processing technology, is also expanding applications and capabilities across multiple domains. The industry is constantly confronted with demands for higher performance and energy efficiency, which are critical factors shaping its evolution. The dominant technology, complementary metal-oxide-semiconductor (CMOS), uses metal-oxide-semiconductor field-effect transistor (MOSFET) inverters. However, shrinking MOSFETs below 10nm faces challenges such as high gate leakage, maintaining a high Ion/Ioff ratio, short channel effects and high power dissipation. In response to these challenges, micro- and nanoscale strain is emerging as a critical factor in modifying Si lattice parameters and Si band structure, leading to improved electronic mobility. Strain engineering and surface bonding techniques are increasingly employed, with silicon-germanium, particularly in the context of strained silicon technology, being a promising approach. This technology, which involves stretching silicon atoms in the layer beyond their normal interatomic spacing, is becoming an integral part of the manufacture of next generation semiconductor devices, impacting computing, communications and consumer electronics. In parallel, the PV industry is focusing on developing low-cost, high-efficiency solar cells using thinner silicon substrates (<100 μm) to reduce costs. Ultra-thin c-Si wafers offer higher conversion efficiency, flexibility and lower weight, making them suitable for building-integrated PV. However, there are concerns about mechanical yield loss due to micro and nano cracks during handling and processing of thin wafers. The implementation of stress control and stringent process control, similar to modern electronics manufacturing, is critical to maintaining reliability and lifetime in thin Si wafer and solar cell production. The increasing demand to determine the local value of the strain tensor and to control the properties of micro-nanomaterials and semiconductor devices underlines the need for advanced high-resolution characterization techniques. In today's micro- and nano-electronics fabrication facilities, there's a growing need for faster and non-destructive characterization tools, especially for strain monitoring during fabrication stages and real-time quality control through in-line monitoring. While Transmission Electron Microscopy (TEM)-based techniques have traditionally been the reference standard for nano-deformation analysis, they are destructive, expensive and time-consuming. This research explores the application of advanced spectroscopic and non-destructive characterization techniques, including µ-RAMAN Spectroscopy, Photoluminescence Spectroscopy and Tip-Enhanced Raman Spectroscopy (TERS). In addition, these techniques are validated with High Resolution X-ray Diffraction (HRXRD). µ-RAMAN spectroscopy provides insight into strain values and crystallinity defects, but its lateral resolution is limited by the Abbe diffraction limit. Consequently, the focus is shifting to the implementation of TERS, which combines the high spatial resolution of a scanning probe microscope (SPM) with the high chemical/molecular sensitivity of a Raman spectrometer, making it an excellent solution to these needs, with the potential to achieve nanoscale resolution and well placed to become a reliable, accurate technique with real-time capacity configurations. The key concept of TERS is the nanometric tip-induced plasmonic resonance, which acts as an antenna to enhance signal collection from the surface layer of the sample. The research involves evaluation and comparison of commercial metal (Ag/Au) TERS tips with innovative material-coated (TiN) TERS tips, aiming for compatibility with production environments (clean room) and improved reliability. The activities of this thesis have been carried out in the framework of the European project Challenges (Real time nano CHAracterization reLatEd techNloGiEeS -https://cordis.europa.eu/project/id/861857) and the results obtained are the outcome of a strong collaboration between the partners, in particular with Cea-Leti (where part of the thesis work of the PhD project was carried out) and Scansens GmbH, which further strengthens the interdisciplinary approach to the challenges of the next generation of electronic devices. In this context, the main objective reported in this thesis is to demonstrate the potential and reliability of the TERS technique to be integrated as an in-line technique for real-time monitoring of advanced semiconductor devices. The analyses focused on devices selected within the context of the semiconductor industry and Si photovoltaic applications. The objective was to demonstrate the potential for achieving nanometer lateral resolution, obtaining accurate nanoscale deformation data, generating strain field maps and identifying specific defects in these devices. As well as contributing to the advancement of characterization techniques, the research is also in line with the broader objectives of the Challenges project, providing insights into the development of nanoscale metrology for real-time applications in semiconductor manufacturing.

Research products

11573/1710525 - 2024 - Correlative microscopy and Micro-Raman spectroscopy for enhancing the evaluation of corrosion damage in archaeological objects
Bernabale, M.; Cognigni, F.; Contessi, S.; Silvestri, S.; La Penna, G.; Spagnoli, F.; De Vito, C.; Rossi, Marco - 01a Articolo in rivista
paper: JOURNAL OF CULTURAL HERITAGE (Paris: Elsevier, cop. 1999-) pp. 500-511 - issn: 1296-2074 - wos: WOS:001240452600001 (0) - scopus: 2-s2.0-85192712898 (0)

11573/1718935 - 2024 - Investigating corrosion systems in archaeological artifacts from Motya (Sicily, Italy): A Micro-Raman Spectroscopy and Correlative Imaging approach
Bernabale, M.; Cognigni, F.; Contessi, S.; Silvestri, S.; La Penna, G.; Spagnoli, F.; De Vito, C.; Rossi, Marco - 04d Abstract in atti di convegno
conference: Congresso congiunto SGI-SIMP (Bari)
book: Geology for a sustainable management of our Planet - ()

11573/1713453 - 2024 - From AFM to TERS: Unveiling the Nanoscale Morphological and Chemical Composition of Bovine Milk-Derived Extracellular Vesicles
Buccini, Luca; Proietti, Anacleto; La Penna, Giancarlo; Mancini, Chiara; Mura, Francesco; Rossi, Marco; Passeri, Daniele - 04f Poster
conference: Symposium on microscopic characterization of the solid/liquid interface (Vallesana training center, Sondalo (Sondrio, Lombardia, Italia))
book: Symposium on microscopic characterization of the solid/liquid interface - ()

11573/1718093 - 2024 - Raman and Tip-Enhanced Raman spectroscopy characterization of milk-derived extracellular vesicles: Toward nanoscale single vesicle analysis
Buccini, Luca; Proietti, Anacleto; La Penna, Giancarlo; Mancini, Chiara; Mura, Francesco; Rossi, Marco; Passeri, Daniele - 04f Poster
conference: 28th International Conference on Raman Spectroscopy – ICORS 2024 (Rome)
book: ICORS-2024 - ()

11573/1709439 - 2024 - Toward the nanoscale chemical and physical probing of milk-derived extracellular vesicles using Raman and tip-enhanced Raman spectroscopy
Buccini, Luca; Proietti, Anacleto; La Penna, Giancarlo; Mancini, Chiara; Mura, Francesco; Tacconi, Stefano; Dini, Luciana; Rossi, Marco; Passeri, Daniele - 01a Articolo in rivista
paper: NANOSCALE (Cambridge,UK: RCS PUBLISHING -Royal Society of Chemistry) pp. 8132-8142 - issn: 2040-3364 - wos: WOS:001196109900001 (0) - scopus: 2-s2.0-85189558073 (0)

11573/1724131 - 2024 - Long-term monitoring of the hypogeal Etruscan Tomba degli Scudi, Tarquinia, Italy. Early detection of black spots, investigation of fungal community, and evaluation of their biodeterioration potential
Kratter, Matilde; Beccaccioli, Marzia; Vassallo, Ylenia; Benedetti, Francesca; La&Nbsp;, ; La Penna, Giancarlo; Proietti, Anacleto; Zanellato, Gianluca; Faino, Luigi; Cirigliano, Angela; Neisje&Nbsp;, De&Nbsp;; Kruif, Fiona; Tomassetti Maria, Cristina; Rossi, Marco; Reverberi, Massimo; Quagliariello, Andrea; Rinaldi, Teresa - 01a Articolo in rivista
paper: JOURNAL OF APPLIED MICROBIOLOGY (Oxford: Blackwell Science.) pp. - - issn: 1365-2672 - wos: (0) - scopus: 2-s2.0-85207601454 (0)

11573/1710783 - 2024 - CHALLENGES: Advanced cleanroom compatible TiN probes for Tip-Enhanced Raman Spectroscopy
La Penna, Giancarlo; Mancini, Chiara; Mura, Francesco; Buccini, Luca; Passeri, Daniele; Rossi, Marco - 04f Poster
conference: EMRS - 2024 Spring Meeting (Strasbourg, France)
book: EMRS - Spring meeting 2024 - ()

11573/1709435 - 2024 - Strained silicon technology: non-destructive high-lateral-resolution characterization through tip-enhanced raman spectroscopy
La Penna, Giancarlo; Mancini, Chiara; Proietti, Anacleto; Buccini, Luca; Passeri, Daniele; Gambacorti, Narciso; Richy, Jérôme; Rossi, Marco - 01a Articolo in rivista
paper: APPLIED SPECTROSCOPY (- [London]: SAGE - [Frederick Md.]: Society for Applied Spectroscopy) pp. - - issn: 1943-3530 - wos: WOS:001204877400001 (0) - scopus: 2-s2.0-85190769815 (0)

11573/1724748 - 2024 - Analyzing the structure and chemical composition of an Etruscan bronze fibula from Tomb Number 129 at Vulci (VT, Italy) through a non-destructive multi-analytical approach
Porcaro, M.; Cognigni, F.; La Penna, G.; Proietti, A.; Regoli, Carlo.; Casi, Carlo.; Carosi, S.; Rossi, Marco; Brunetti, Antonio.; De Vito, C. - 04d Abstract in atti di convegno
conference: Congresso congiunto SGI-SIMP (Bari)
book: Geology for a sustainable management of our Planet - ()

11573/1719593 - 2024 - Multi-scale Characterization of laser-induced defects in the production of heterojunction photovoltaic cells
Proietti, Anacleto; Buccini, Luca; Atanasio, Pierfrancesco; La Penna, Giancarlo; Mancini, Chiara; Di Conzo, Corrado; Mura, Francesco; Galiazzo, Marco; Frasson, Nicola; Passeri, Daniele; Rossi, Marco - 04f Poster
conference: European Microscopy Congress 2024 (EMC 2024) (Copenaghen)
book: EMC 2024 - ()

11573/1701832 - 2024 - Strained silicon Technology: Non-destructive nanoscale characterization through Tip-Enhanced Raman Spectroscopy
Proietti, Anacleto; Mancini, Chiara; La Penna, Giancarlo; Atanasio, Pierfrancesco; Buccini, Luca; Passeri, Daniele; Rossi, Marco - 04f Poster
conference: WORKSHOP SHARESCIENCE (Rome, Italy)
book: WORKSHOP SHARESCIENCE - ()

11573/1691309 - 2023 - Analysis of Roman Era archaeological finds from Museo Territoriale del Lago di Bolsena with non-destructive investigation techniques
Alemanno, Valentina; Atanasio, Pierfrancesco; La Penna, Giancarlo; Mancini, Chiara; Cognigni, Flavio; Silvestri, Serena; Proietti, Anacleto; Rossi, Marco; Ciccola, Alessandro; Nucara, Alessandro; Barbaro, Barbara; Binaco, Paolo; Dini, Danilo - 04b Atto di convegno in volume
conference: MetroArchaeo - 2023 IMEKO INTERNATIONAL CONFERENCE ON Metrology for Archaeology and Cultural Heritage (Roma)
book: 2023 IMEKO International conference on metrology for archaelogy and cultural heritage. Metro archaeo - (9789299009062)

11573/1700497 - 2023 - Analysis of Roman era archaeological finds from Museo Territoriale del Lago di Bolsena with non-destructive investigation techniques
Alemanno, Valentina; Atanasio, Pierfrancesco; La Penna, Giancarlo; Mancini, Chiara; Cognigni, Flavio; Silvestri, Serena; Proietti, Anacleto; Rossi, Marco; Ciccola, Alessandro; Nucara, Alessandro; Barbaro, Barbara; Binaco, Paolo; Dini, Danilo - 04b Atto di convegno in volume
conference: International Conference on Metrology for Archaeology and Cultural Heritage (Rome, Italy)
book: Proceedings - IMEKO TC4 International Conference on Metrology for Archaeology and Cultural Heritage - (978-92-990090-6-2)

11573/1697357 - 2023 - Strain characterization in SiGe epitaxial samples by Tip Enhanced Raman Spectroscopy
La Penna, Giancarlo; Mancini, Chiara; Proietti, Anacleto; Silvestri, Serena; Buccini, Luca; Passeri, Daniele; Gambacorti, Narciso; Richy, Jerome; Rossi, Marco - 04f Poster
conference: Nanoinnovation 2023 Conference & Exhibition (Faculty of Civil and Industrial Engineering (via Eudossiana) - Sapienza University of Rome, Roma)
book: Nanoinnovation 2023: book of abstract, poster session - ()

11573/1684898 - 2023 - Strain characterization in SiGe epitaxial samples by Tip Enhanced Raman Spectroscopy
La Penna, Giancarlo; Mancini, Chiara; Proietti, Anacleto; Silvestri, Serena; Buccini, Luca; Passeri, Daniele; Gambacorti, Narciso; Richy, Jérôme; Rossi, Marco - 04f Poster
conference: VISPEC 2023 School & Conference (Perugia, Italy)
book: VISPEC 2023: book of abstract, poster session - ()

11573/1684897 - 2023 - Challenges - real time nano characterization related technlogieeS
Proietti, Anacleto; La Penna, Giancarlo; Mancini, Chiara; Passeri, Daniele; Gambacorti, Narciso; Galiazzo, Marco; Zurutuza, Amaia; Centeno, Alba; Rossi, Marco - 04f Poster
conference: EuroNanoForum 2023 (Lund; Sweden)
book: EuroNanoForum 2023: Poster session - ()

11573/1661436 - 2022 - Comparison of different correlative AFM-SEM workflows on calcite moonmilk
Dinarelli, S; Mura, F; Mancini, C; La Penna, G; Rinaldi, T; Rossi, M - 04c Atto di convegno in rivista
paper: IOP CONFERENCE SERIES: MATERIALS SCIENCE AND ENGINEERING (IOP electronic journals) pp. - - issn: 1757-8981 - wos: (0) - scopus: (0)
conference: Nanoinnovation 2021 (Roma)

11573/1639927 - 2022 - Metal ion binding in wild-type and mutated frataxin: a stability study
Morante, S; Botticelli, S; Chiaraluce, R; Consalvi, V; La Penna, G; Novak, L; Pasquo, A; Petrosino, M; Proux, O; Rossi, G; Salina, G And Stellato F - 01a Articolo in rivista
paper: FRONTIERS IN MOLECULAR BIOSCIENCES (Lausanne : Frontiers Media S.A., 2014-) pp. - - issn: 2296-889X - wos: WOS:000810933200001 (0) - scopus: 2-s2.0-85132388442 (0)

11573/1639921 - 2019 - Dealing with Cu reduction in X-ray absorption spectroscopy experiments
Stellato, F.; Chiaraluce, R.; Consalvi, V.; De Santis, E.; La Penna, G.; Proux, O.; Rossi, G.; Morante, S. - 01a Articolo in rivista
paper: METALLOMICS (Cambridge : Royal Society of Chemistry, 2009-) pp. 1401-1410 - issn: 1756-5901 - wos: WOS:000481416000006 (10) - scopus: 2-s2.0-85070831339 (10)

© Università degli Studi di Roma "La Sapienza" - Piazzale Aldo Moro 5, 00185 Roma