11573/1064594 - 2018 -
L-DOPA and freezing of gait in Parkinson's disease: Objective assessment through a wearable wireless system Suppa, Antonio; Kita, Ardian; Leodori, Giorgio; Zampogna, Alessandro; Nicolini, Ettore; Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda - 01a Articolo in rivista
paper: FRONTIERS IN NEUROLOGY (Lausanne: Frontiers Research Foundation, 2010-) pp. 1-14 - issn: 1664-2295 - wos: WOS:000407591300001 (55) - scopus: 2-s2.0-85027397242 (61)
11573/936838 - 2017 -
Reliable and robust detection of freezing of gait episodes with wearable electronic devices Kita, Ardian; Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda - 01a Articolo in rivista
paper: IEEE SENSORS JOURNAL (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 1899-1908 - issn: 1530-437X - wos: WOS:000395895200039 (18) - scopus: 2-s2.0-85015322455 (22)
11573/963835 - 2016 -
Smart Sensing System for the Detection of Specific Human Motion Symptoms of the Parkinson’s Disease Irrera, Fernanda; Berardelli, Alfredo; Bologna, Matteo; Suppa, Antonio; Parisi, R.; Rao, Rosario; Romano, G.; Lorenzi, Paolo; Kita, Ardian - 04a Atto di comunicazione a congresso
11573/936660 - 2016 -
Mobile devices for the real-time detection of specific human motion disorders Lorenzi, Paolo; Rao, Rosario; Romano, Giulio; Kita, Ardian; Irrera, Fernanda - 01a Articolo in rivista
paper: IEEE SENSORS JOURNAL (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 8220-8227 - issn: 1530-437X - wos: WOS:000388218100006 (28) - scopus: 2-s2.0-84997285661 (37)
11573/936662 - 2016 -
Using neural networks for the recognition of specific motion symptoms of the parkinson’s disease Lorenzi, Paolo; Rao, Rosario; Romano, Giulio; Kita, Ardian; Serpa, Martin; Filesi, Federico; Bologna, Matteo; Suppa, Antonello; Berardelli, Alfredo; Irrera, Fernanda - 02a Capitolo o Articolo
book: Smart Innovation, Systems and Technologies - (9783319337463; 9783319337463)
11573/963842 - 2015 -
Wearable Wireless Inertial Sensors for Long-Time Monitoring of Specific Motor Symptoms in Parkinson’s Disease Irrera, Fernanda; Berardelli, Alfredo; Romano, Giulio; Parisi, Riccardo; Kita, Ardian; Suppa, Antonio; Rao, Rosario; Lorenzi, Paolo - 04a Atto di comunicazione a congresso
11573/668862 - 2015 -
Role of the electrode metal, temperature and waveform geometry on SET and RESET in HfO2-based RRAM 1R-cells: experimental aspects Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda - 01a Articolo in rivista
paper: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B (Slack Incorporated:6900 Grove Road:Thorofare, NJ 08086:(800)257-8290, (856)848-1000, EMAIL: customerservice@slackinc.com, INTERNET: http://www.slackinc.com, Fax: (856)853-5991) pp. - - issn: 1071-1023 - wos: WOS:000348915500007 (16) - scopus: 2-s2.0-84923644287 (15)
11573/846937 - 2015 -
Conductive filament evolution in HfO2 resistive RAM device during constant voltage stress Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda - 01a Articolo in rivista
paper: MICROELECTRONICS RELIABILITY (ATTUALE:
Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010
PRECEDENTE:
Pergamon Press., Oxford) pp. 1446-1449 - issn: 0026-2714 - wos: WOS:000364256400034 (4) - scopus: 2-s2.0-84943454622 (5)
11573/846322 - 2015 -
A thorough investigation of the progressive reset dynamics in HfO2-based resistive switching structures Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda; Suñé, J.; Miranda, E. - 01a Articolo in rivista
paper: APPLIED PHYSICS LETTERS (New York: American Institute of Physics) pp. 113507- - issn: 0003-6951 - wos: WOS:000361639200056 (7) - scopus: 2-s2.0-84941985566 (6)
11573/963839 - 2015 -
Smart sensors for the recognition of specific human motion disorders in Parkinson's disease Lorenzi, Paolo; Rao, Rosario; Romano, G.; Kita, Ardian; Serpa, M.; Filesi, F.; Irrera, Fernanda; Bologna, Matteo; Suppa, Antonio; Berardelli, Alfredo - 04b Atto di convegno in volume
conference: 2015 6th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2015 (Gallipoli; Italy)
book: Proceedings - 2015 6th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2015 - (9781479989805)
11573/846938 - 2015 -
Model of reversible breakdown in HfO2 based on fractal patterns Lorenzi, Paolo; Rao, Rosario; Romano, Giulio; Irrera, Fernanda - 01a Articolo in rivista
paper: ADVANCES IN CONDENSED MATTER PHYSICS (Cairo: Hindawi Publishing Corporation) pp. 1-8 - issn: 1687-8108 - wos: WOS:000349113200001 (1) - scopus: 2-s2.0-84922342209 (2)
11573/854489 - 2015 -
Smart sensing systems for the detection of human motion disorders Lorenzi, Paolo; Rao, Rosario; Romano, Giulio; Kita, Ardian; Serpa, M; Filesi, F; Parisi, R; Suppa, Antonio; Bologna, Matteo; Berardelli, Alfredo; Irrera, Fernanda - 01a Articolo in rivista
paper: PROCEDIA ENGINEERING (Amsterdam : Elsevier) pp. 324-327 - issn: 1877-7058 - wos: WOS:000380499300073 (13) - scopus: 2-s2.0-84985038542 (13)
11573/936661 - 2015 -
Memristor based neuromorphic circuit for visual pattern recognition Lorenzi, Paolo; Sucre, V.; Romano, Giulio; Rao, Rosario; Irrera, Fernanda - 04b Atto di convegno in volume
conference: International Conference on Memristive Systems, MEMRISYS 2015 (Paphos; Cyprus)
book: 2015 International Conference on Memristive Systems, MEMRISYS 2015 - (9781467392099)
11573/620380 - 2014 -
Advanced methodology for electrical characterization of metal/high-k interfaces Rao, Rosario; Lorenzi, Paolo; Irrera, Fernanda - 01a Articolo in rivista
paper: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B (Slack Incorporated:6900 Grove Road:Thorofare, NJ 08086:(800)257-8290, (856)848-1000, EMAIL: customerservice@slackinc.com, INTERNET: http://www.slackinc.com, Fax: (856)853-5991) pp. 03D120- - issn: 1071-1023 - wos: WOS:000337061900020 (1) - scopus: 2-s2.0-84921999476 (1)
11573/514613 - 2013 -
Forming kinetics in HfO2-Based RRAM cells Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda - 01a Articolo in rivista
paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 438-443 - issn: 0018-9383 - wos: WOS:000316816200065 (34) - scopus: 2-s2.0-84871762848 (41)
11573/531062 - 2013 -
Impact of the forming conditions and electrode metals on read disturb in HfO2-based RRAM Lorenzi, Paolo; Rao, Rosario; T., Prifti; Irrera, Fernanda - 01a Articolo in rivista
paper: MICROELECTRONICS RELIABILITY (ATTUALE:
Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010
PRECEDENTE:
Pergamon Press., Oxford) pp. 1203-1207 - issn: 0026-2714 - wos: WOS:000328588000008 (11) - scopus: 2-s2.0-84988350380 (12)
11573/441858 - 2012 -
Impact of forming pulse geometry and area scaling on forming kinetics and stability of the low resistance state in HfO2-based RRAM cells Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda - 04b Atto di convegno in volume
conference: 4th IEEE International Memory Workshop (IMW) (Milano; Italy)
book: Proc. 4th IEEE International Memory Workshop (IMW) - (9781467310796; 9781467310802; 9781467310819)
11573/439331 - 2011 -
Experimental and Theoretical Study of Electrode Effects in HfO2 based RRAM C., Cagli; J., Buckley; V., Jousseaume; T., Cabout; A., Salaun; H., Grampeix; J. F., Nodin; H., Feldis; A., Persico; J., Cluzel; Lorenzi, Paolo; L., Massari; Rao, Rosario; Irrera, Fernanda; F., Aussenac; C., Carabasse; M., Coue; P., Calka; E., Martinez; L., Perniola; P., Blaise; Z., Fang; Y. H., Yu; G., Ghibaudo; D., Deleruyelle; M., Bocquet; C., Muller; A., Padovani; O., Pirrotta; L., Vandelli; L., Larcher; G., Reimbold; B., De Salvo - 04b Atto di convegno in volume
conference: 2011 IEEE International Electron Devices Meeting (IEDM) (Washington, DC, USA)
book: 2011 International Electron Devices Meeting - (9781457705045; 9781457705052; 9781457705069)
11573/406541 - 2011 -
Nanometric Resistive Memories for the next technology node Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda; J., Buckley; C., Cagli; B., De Salvo - 04d Abstract in atti di convegno
conference: NANOTECHITALY (VENICE)
11573/326206 - 2010 -
Advanced Characterization of Metal/High-k Interface Irrera, Fernanda; Lorenzi, Paolo; Rao, Rosario; R., Simoncini; G., Ghidini; H. D. B., Gottlob; M., Schmidt - 04a Atto di comunicazione a congresso
conference: ULTIMATE SCALING ON SILICON (GLASGOW)
book: International Conference on Ultimate Integration of Silicon, ULIS. - ()
11573/362189 - 2010 -
Electron-Related Phenomena at the TaN/Al2O3 Interface Rao, Rosario; Lorenzi, Paolo; G., Ghidini; Palma, Fabrizio; Irrera, Fernanda - 01a Articolo in rivista
paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 637-643 - issn: 0018-9383 - wos: WOS:000274993100014 (10) - scopus: 2-s2.0-77649186886 (11)
11573/407877 - 2009 -
Charge Trapping Nanoelectronic Memories Lorenzi, Paolo; Rao, Rosario; Palma, Fabrizio; G., Ghidini; Irrera, Fernanda - 01a Articolo in rivista
conference: IEEE-NANOTECHNOLOGY (GENOVA)
Lorenzi, Paolo; Rao, Rosario; Palma, Fabrizio; G., Ghidini; Irrera, Fernanda - 01a Articolo in rivista
paper: ECS TRANSACTIONS (Pennington, N.J. : The Electrochemical Society) pp. - - issn: 1938-5862 - wos: WOS:000338102400026 (1) - scopus: 2-s2.0-84988429367 (1)
conference: IEEE ELECTROCHEMICAL SOCIETY ULTRA LARGE SCALE INTEGRATION (WIEN)