FERNANDA IRRERA

Full professor

email: fernanda.irrera@uniroma1.it
phone: 3204357253

Research products

11573/1756059 - 2025 - Synthesis and stabilization of ultra-narrow direct bandgap nanoparticles of a-Sn on Si through a CMOS compatible process

Bertoli, Tiziano; Stellino, Elena; Minati, Francesco; Belloni, Camilla; Palma, Fabrizio; Bosco, Emanuele; Back, Michele; Logoteta, Demetrio; Battisti, Silvano; Nucara, Alessandro; Saini, Naurang Lal; Riello, Pietro; Irrera, Fernanda - 04d Abstract in atti di convegno

conference: 9th International Conference on Theoretical and Applied Nanoscience and Nanotechnology, TANN 2025 (London, United Kingdom)

book: Proceedings of the International Conference of Theoretical and Applied Nanoscience and Nanotechnology - ()

11573/1756060 - 2025 - Tuning ultra‐narrow direct bandgap in α‐Sn nanocrystals. A CMOS‐compatible approach for THz applications

Bertoli, Tiziano; Stellino, Elena; Minati, Francesco; Belloni, Camilla; Tomassucci, Giovanni; Bosco, Emanuele; Battisti, Silvano; Puppulin, Leonardo; Cristofori, Davide; Morandi, Vittorio; Rossi, Francesca; Logoteta, Demetrio; Nucara, Alessandro; Barba, Luisa; Campi, Gaetano; Saini, Naurang Lal; Palma, Fabrizio; Riello, Pietro; Back, Michele; Irrera, Fernanda - 01a Articolo in rivista

paper: SMALL (Weinheim : Wiley-VCH-Verl.) pp. 1-11 - issn: 1613-6810 - wos: WOS:001605748800001 (0) - scopus: 2-s2.0-105020720766 (0)

11573/1754260 - 2025 - Single-channel wearable EEG using low-power Qvar sensor and machine learning for drowsiness detection

Cotrone, Michele Antonio Gazzanti Pugliese Di; Balsi, Marco; Picozzi, Nicola; Zampogna, Alessandro; Bouchelaghem, Soufyane; Suppa, Antonio; Davì, Leonardo; Fabeni, Denise; Gumiero, Alessandro; Ferri, Ludovica; Della Torre, Luigi; Pulitano, Patrizia; Irrera, Fernanda - 01a Articolo in rivista

paper: IEEE SENSORS JOURNAL (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 40668-40679 - issn: 1530-437X - wos: (0) - scopus: 2-s2.0-105017599696 (0)

11573/1754266 - 2025 - A novel machine learning framework for drowsiness detection using an electrostatic wearable sensor and hyperdimensional computing

Ferri, L.; Di Cotrone, M. G. P.; Angioli, M.; Balsi, M.; Suppa, A.; Davi, L.; Picozzi, N.; Gumiero, A.; Torre, L. D.; Irrera, F. - 04b Atto di convegno in volume

conference: 8th IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd4.0 and IoT 2025 (esp)

book: 2025 IEEE International workshop on metrology for industry 4.0 and IoT, metroInd4.0 and IoT 2025. Proceedings - ()

11573/1706913 - 2024 - A comprehensive study of negative bias temperature instability in MOS structures

Irrera, Fernanda; Broccoli, Giordano - 01a Articolo in rivista

paper: MICROELECTRONICS RELIABILITY (ATTUALE: Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010 PRECEDENTE: Pergamon Press., Oxford) pp. 1-6 - issn: 0026-2714 - wos: WOS:001299059700001 (3) - scopus: 2-s2.0-85188230837 (5)

11573/1706916 - 2024 - Multisensor integrated platform based on MEMS charge variation sensing technology for biopotential acquisition

Irrera, Fernanda; Gumiero, Alessandro; Zampogna, Alessandro; Boscari, Federico; Avogaro, Angelo; Gazzanti Pugliese Di Cotrone, Michele Antonio; Patera, Martina; Della Torre, Luigi; Picozzi, Nicola; Suppa, Antonio - 01a Articolo in rivista

paper: SENSORS (Basel : Molecular Diversity Preservation International (MDPI), 2001-) pp. 1-20 - issn: 1424-8220 - wos: WOS:001183006800001 (1) - scopus: 2-s2.0-85187489097 (3)

11573/1721381 - 2024 - Supercapacitor-enabled energy-autonomous wireless sensor node for sustainable and remote sensing applications

Rosa, R. L.; Spaziani, S.; Irrera, F. - 04b Atto di convegno in volume

conference: Melecon 2024 (Porto; Portugal)

book: 10.1109/MELECON56669.2024.10608785. - (9798350387025)

11573/1688094 - 2023 - Automatic detection of myotonia using a sensory glove with resistive flex sensors and machine learning techniques

Cesarini, V.; Costantini, G.; Amato, F.; Errico, V.; Pietrosanti, L.; Calado, A. L.; Massa, R.; Frezza, E.; Irrera, F.; Manoni, A.; Saggio, G. - 04b Atto di convegno in volume

conference: 6th IEEE International Workshop on Metrology for Industry 4.0 and IoT, MetroInd4.0 and IoT 2023 (Brescia; Italy)

book: 2023 IEEE International Workshop on Metrology for Industry 4.0 & IoT (MetroInd4.0&IoT), - (979-8-3503-9657-7)

11573/1612840 - 2022 - Predicting axial impairment in parkinson’s disease through a single inertial sensor

Borzi, L.; Mazzetta, I.; Zampogna, A.; Suppa, A.; Irrera, F.; Olmo, G. - 01a Articolo in rivista

paper: SENSORS (Basel : Molecular Diversity Preservation International (MDPI), 2001-) pp. 1-22 - issn: 1424-8220 - wos: WOS:000757681100001 (16) - scopus: 2-s2.0-85122185894 (18)

11573/1631422 - 2022 - Long-Term Polygraphic Monitoring through MEMS and Charge Transfer for Low-Power Wearable Applications

Manoni, A.; Gumiero, A.; Zampogna, A.; Ciarlo, C.; Panetta, L.; Suppa, A.; Torre, L. D.; Irrera, F. - 01a Articolo in rivista

paper: SENSORS (Basel : Molecular Diversity Preservation International (MDPI), 2001-) pp. 2566- - issn: 1424-8220 - wos: WOS:000781204400001 (6) - scopus: 2-s2.0-85126982102 (7)

11573/1631264 - 2022 - Microwave driven synthesis of narrow bandgap alpha-tin nanoparticles on silicon

Mazzetta, I.; Viti, L.; Rigoni, F.; Quaranta, S.; Gasparotto, A.; Barucca, G.; Palma, F.; Riello, P.; Cattaruzza, E.; Asgari, M.; Vitiello, M.; Irrera, F. - 01a Articolo in rivista

paper: MATERIALS & DESIGN (- Amsterdam: Elsevier Science -Reigate : Scientific and Technical Press, 1982- -Oxford OX2 8DP United Kingdom: Butterworth Heinemann Publishers) pp. 1-9 - issn: 0264-1275 - wos: WOS:000793629500009 (4) - scopus: 2-s2.0-85128233094 (5)

11573/1556257 - 2021 - Prediction of freezing of gait in parkinson’s disease using wearables and machine learning

Borzi, L.; Mazzetta, I.; Zampogna, A.; Suppa, A.; Olmo, G.; Irrera, F. - 01a Articolo in rivista

paper: SENSORS (Basel : Molecular Diversity Preservation International (MDPI), 2001-) pp. 1-19 - issn: 1424-8220 - wos: WOS:000611698100001 (83) - scopus: 2-s2.0-85099523812 (102)

11573/1631546 - 2021 - A clinical and kinematic evaluation of foot drop in myotonic dystrophy type I: A pilot study

Frezza, Erica; Manoni, Alessandro; Errico, Vito; Rota, Rosario; Greco, Giulia; Goglia, Mariangela; Irrera, Fernanda; Saggio, Giovanni; Massa, Roberto - 01h Abstract in rivista

paper: JOURNAL OF THE NEUROLOGICAL SCIENCES (Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598) pp. - - issn: 0022-510X - wos: WOS:000713637303504 (0) - scopus: (0)

11573/1556255 - 2021 - Influence of common source and word line electrodes on program operation in superflash memory

Mazzetta, I.; Irrera, F. - 01a Articolo in rivista

paper: ELECTRONICS (Basel : MDPI) pp. 1-14 - issn: 2079-9292 - wos: WOS:000614958700001 (1) - scopus: 2-s2.0-85100077741 (1)

11573/1556249 - 2021 - Large-scale CMOS-compatible process for silicon nanowires growth and BC8 phase formation

Mazzetta, I.; Rigoni, F.; Irrera, F.; Riello, P.; Quaranta, S.; Latini, A.; Palma, F. - 01a Articolo in rivista

paper: SOLID-STATE ELECTRONICS (Oxford: Pergamon, 1960-) pp. - - issn: 0038-1101 - wos: WOS:000702863100001 (1) - scopus: 2-s2.0-85107770398 (1)

11573/1556253 - 2021 - Objective assessment of walking impairments in myotonic dystrophy by means of a wearable technology and a novel severity index

Saggio, G.; Manoni, A.; Errico, V.; Frezza, E.; Mazzetta, I.; Rota, R.; Massa, R.; Irrera, F. - 01a Articolo in rivista

paper: ELECTRONICS (Basel : MDPI) pp. 1-13 - issn: 2079-9292 - wos: WOS:000634339500001 (0) - scopus: 2-s2.0-85102552327 (2)

11573/1556251 - 2021 - Electrical spin-wave spectroscopy in nanoscale waveguides with nonuniform magnetization

Talmelli, G.; Narducci, D.; Vanderveken, F.; Heyns, M.; Irrera, F.; Asselberghs, I.; Radu, I. P.; Adelmann, C.; Ciubotaru, F. - 01a Articolo in rivista

paper: APPLIED PHYSICS LETTERS (New York: American Institute of Physics) pp. - - issn: 0003-6951 - wos: WOS:000642043400001 (11) - scopus: 2-s2.0-85104238373 (11)

11573/1556259 - 2020 - A new wearable system for home sleep apnea testing, screening, and classification

Manoni, A.; Loreti, F.; Radicioni, V.; Pellegrino, D.; Torre, L. D.; Gumiero, A.; Halicki, D.; Palange, P.; Irrera, F. - 01a Articolo in rivista

paper: SENSORS (Basel : Molecular Diversity Preservation International (MDPI), 2001-) pp. 1-26 - issn: 1424-8220 - wos: WOS:000603312300001 (42) - scopus: 2-s2.0-85097574741 (60)

11573/1556263 - 2020 - A neural network implemented on NAND memory

Minucci, U.; Santis, L. D.; Irrera, F.; Vali, T. - 04b Atto di convegno in volume

conference: 2020 IEEE International Memory Workshop, IMW 2020 (deu)

book: 2020 IEEE International Memory Workshop, IMW 2020 - Proceedings - (978-1-7281-6306-2)

11573/1397997 - 2020 - On border traps in back-side-illuminated CMOS image sensor oxides

Vici, A.; Russo, F.; Lovisi, N.; Irrera, F. - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 2022-2027 - issn: 0018-9383 - wos: WOS:000538156600015 (1) - scopus: 2-s2.0-85083967193 (2)

11573/1397999 - 2020 - Performance and reliability degradation of CMOS Image Sensors in Back-Side Illuminated configuration

Vici, Andrea; Russo, Felice; Lovisi, Nicola; Marchioni, Aldo; Casella, Antonio; Irrera, Fernanda - 01a Articolo in rivista

paper: IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY (New York, NY : Institute of Electrical and Electronics Engineers) pp. 1-7 - issn: 2168-6734 - wos: WOS:000559512700005 (2) - scopus: 2-s2.0-85089934655 (2)

11573/1458551 - 2020 - Shedding light on nocturnal movements in parkinson’s disease: Evidence from wearable technologies

Zampogna, A.; Manoni, A.; Asci, F.; Liguori, C.; Irrera, F.; Suppa, A. - 01g Articolo di rassegna (Review)

paper: SENSORS (Basel : Molecular Diversity Preservation International (MDPI), 2001-) pp. 1-25 - issn: 1424-8220 - wos: WOS:000581749500001 (24) - scopus: 2-s2.0-85090923683 (26)

11573/1414794 - 2020 - Fifteen years of wireless sensors for balance assessment in neurological disorders

Zampogna, Alessandro; Mileti, Ilaria; Palermo, Eduardo; Celletti, Claudia; Paoloni, Marco; Manoni, Alessandro; Mazzetta, Ivan; Dalla Costa, Gloria; Pérez-López, Carlos; Camerota, Filippo; Leocani, Letizia; Cabestany, Joan; Irrera, Fernanda; Suppa, Antonio - 01a Articolo in rivista

paper: SENSORS (Basel : Molecular Diversity Preservation International (MDPI), 2001-) pp. - - issn: 1424-8220 - wos: WOS:000552737900240 (83) - scopus: 2-s2.0-85086140643 (88)

11573/1556267 - 2019 - A machine learning-based approach to optimize repair and increase yield of embedded flash memories in automotive systems-on-chip

Manzini, A.; Inglese, P.; Caldi, L.; Cantero, R.; Carnevale, G.; Coppetta, M.; Giltrelli, M.; Mautone, N.; Irrera, F.; Ullmann, R.; Bernardi, P. - 04b Atto di convegno in volume

conference: 2019 IEEE European Test Symposium, ETS 2019 (deu)

book: Proceedings of the European Test Workshop - (978-1-7281-1173-5)

11573/1353350 - 2019 - Toward A Quantitative Evaluation of the Fall Risk Using the Fusion of Inertial Signals and Electromyography with Wearable Sensors

Mazzetta, I.; Zampogna, A.; Suppa, A.; Pessione, M.; Irrera, F. - 04b Atto di convegno in volume

conference: 20th International Conference on Solid-State Sensors, Actuators and Microsystems and Eurosensors XXXIII, TRANSDUCERS 2019 and EUROSENSORS XXXIII (Estrel Congress Center, Berlin, Germany)

book: 2019 20th International Conference on Solid-State Sensors, Actuators and Microsystems and Eurosensors XXXIII, TRANSDUCERS 2019 and EUROSENSORS XXXIII - (978-1-5386-8104-6)

11573/1256517 - 2019 - Wearable sensors system for an improved analysis of freezing of gait in Parkinson's disease using electromyography and inertial signals

Mazzetta, Ivan; Zampogna, Alessandro; Suppa, Antonio; Gumiero, Alessandro; Pessione, Marco; Irrera, Fernanda - 01a Articolo in rivista

paper: SENSORS (Basel : Molecular Diversity Preservation International (MDPI), 2001-) pp. 948- - issn: 1424-8220 - wos: WOS:000460829200199 (59) - scopus: 2-s2.0-85064943366 (70)

11573/1556265 - 2019 - Generation of oxide traps in Back-Side-Illuminated CMOS image sensors and impact on reliability

Vici, A.; Russo, F.; Lovisi, N.; Marchioni, A.; Casella, A.; Irrera, F. - 04b Atto di convegno in volume

conference: 49th European Solid-State Device Research Conference, ESSDERC 2019 (pol)

book: European Solid-State Device Research Conference - (978-1-7281-1539-9)

11573/1286544 - 2019 - Through-silicon-trench in back-side-illuminated CMOS image sensors for the improvement of gate oxide long term performance

Vici, Andrea; Russo, F.; Lovisi, N.; Latessa, L.; Marchioni, Andrea; Casella, Anna Rita; Irrera, F. - 04d Abstract in atti di convegno

conference: 64th Annual IEEE International Electron Devices Meeting, IEDM 2018 (usa)

book: Technical Digest - International Electron Devices Meeting, IEDM - (9781728119878)

11573/1114370 - 2018 - Editorial: new advanced wireless technologies for objective monitoring of motor symptoms in Parkinson's disease

Irrera, Fernanda; Cabestany, Joan; Suppa, Antonio - 02c Prefazione/Postfazione

book: New advanced wireless technologies for objective monitoring of motor symptoms in Parkinson's disease - ()

11573/1114364 - 2018 - Stand-alone wearable system for ubiquitous real-time monitoring of muscle activation potentials

Mazzetta, Ivan; Pessione, Marco; Suppa, Antonio; Zampogna, Alessandro; Irrera, Fernanda; Gentile, P.; Bianchini, E. - 01a Articolo in rivista

paper: SENSORS (Basel : Molecular Diversity Preservation International (MDPI), 2001-) pp. 1-13 - issn: 1424-8220 - wos: WOS:000436774300082 (21) - scopus: 2-s2.0-85047901864 (23)

11573/1064594 - 2018 - L-DOPA and freezing of gait in Parkinson's disease: Objective assessment through a wearable wireless system

Suppa, Antonio; Kita, Ardian; Leodori, Giorgio; Zampogna, Alessandro; Nicolini, Ettore; Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda - 01a Articolo in rivista

paper: FRONTIERS IN NEUROLOGY (Lausanne: Frontiers Research Foundation, 2010-) pp. 1-14 - issn: 1664-2295 - wos: WOS:000407591300001 (66) - scopus: 2-s2.0-85027397242 (74)

11573/1064598 - 2017 - Embedded wearable integrating real-time processing of electromyography signals

Gentile, Paolo; Pessione, Marco; Suppa, Antonio; Zampogna, Alessandro; Irrera, Fernanda - 04b Atto di convegno in volume

conference: Eurosensors 2017 (Paris)

book: EUROSENSORS Proceedings 2017, 1(4), 600 - ()

11573/1064595 - 2017 - Wireless sensing system for long-time assistance in the Parkinson’s disease

Irrera, Fernanda; Kita, Ardian; Rao, Rosario; Suppa, Antonio - 04b Atto di convegno in volume

conference: Proceedings of Eurosensors 2017 (Paris; France)

book: EUROSENSORS Proceedings 2017, 1(4), 565 - ()

11573/936838 - 2017 - Reliable and robust detection of freezing of gait episodes with wearable electronic devices

Kita, Ardian; Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda - 01a Articolo in rivista

paper: IEEE SENSORS JOURNAL (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 1899-1908 - issn: 1530-437X - wos: WOS:000395895200039 (22) - scopus: 2-s2.0-85015322455 (28)

11573/963830 - 2017 - Dark current spectroscopy of transition metals in CMOS image sensors

Russo, Felice; Nardone, Giancarlo; Polignano, Maria Luisa; D'ercole, Angelo; Pennella, Fabrizio; Felice, Massimo Di; Monte, Andrea Del; Matarazzo, Antonio; Moccia, Giuseppe; Polsinelli, Gianpaolo; D'angelo, Antonio; Liverani, Massimo; Irrera, Fernanda - 01a Articolo in rivista

paper: ECS JOURNAL OF SOLID STATE SCIENCE AND TECHNOLOGY (Pennington, NJ : Electrochemical Society, 2012-) pp. P217-P226 - issn: 2162-8769 - wos: WOS:000409027700007 (27) - scopus: 2-s2.0-85019905103 (30)

11573/963835 - 2016 - Smart Sensing System for the Detection of Specific Human Motion Symptoms of the Parkinson’s Disease

Irrera, Fernanda; Berardelli, Alfredo; Bologna, Matteo; Suppa, Antonio; Parisi, R.; Rao, Rosario; Romano, G.; Lorenzi, Paolo; Kita, Ardian - 04a Atto di comunicazione a congresso

11573/936660 - 2016 - Mobile devices for the real-time detection of specific human motion disorders

Lorenzi, Paolo; Rao, Rosario; Romano, Giulio; Kita, Ardian; Irrera, Fernanda - 01a Articolo in rivista

paper: IEEE SENSORS JOURNAL (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 8220-8227 - issn: 1530-437X - wos: WOS:000388218100006 (33) - scopus: 2-s2.0-84997285661 (41)

11573/936662 - 2016 - Using neural networks for the recognition of specific motion symptoms of the parkinson’s disease

Lorenzi, Paolo; Rao, Rosario; Romano, Giulio; Kita, Ardian; Serpa, Martin; Filesi, Federico; Bologna, Matteo; Suppa, Antonello; Berardelli, Alfredo; Irrera, Fernanda - 02a Capitolo o Articolo

book: Smart Innovation, Systems and Technologies - (9783319337463; 9783319337463)

11573/837950 - 2015 - Progressive vs. abrupt reset behavior in conductive bridging devices: A C-AFM tomography study

Celano, U.; Goux, L.; Belmonte, A.; Giammaria, G.; Opsomer, K.; Detavernier, C.; Richard, O.; Bender, H.; Irrera, Fernanda; Jurczak, M.; Vandervorst, W. - 04b Atto di convegno in volume

conference: 2014 60th IEEE International Electron Devices Meeting, IEDM 2014 (San Francisco; United States)

book: Technical Digest - International Electron Devices Meeting, IEDM - (978-1-4799-8001-7)

11573/963842 - 2015 - Wearable Wireless Inertial Sensors for Long-Time Monitoring of Specific Motor Symptoms in Parkinson’s Disease

Irrera, Fernanda; Berardelli, Alfredo; Romano, Giulio; Parisi, Riccardo; Kita, Ardian; Suppa, Antonio; Rao, Rosario; Lorenzi, Paolo - 04a Atto di comunicazione a congresso

11573/668862 - 2015 - Role of the electrode metal, temperature and waveform geometry on SET and RESET in HfO2-based RRAM 1R-cells: experimental aspects

Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda - 01a Articolo in rivista

paper: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B (Slack Incorporated:6900 Grove Road:Thorofare, NJ 08086:(800)257-8290, (856)848-1000, EMAIL: customerservice@slackinc.com, INTERNET: http://www.slackinc.com, Fax: (856)853-5991) pp. - - issn: 1071-1023 - wos: WOS:000348915500007 (16) - scopus: 2-s2.0-84923644287 (15)

11573/846937 - 2015 - Conductive filament evolution in HfO2 resistive RAM device during constant voltage stress

Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda - 01a Articolo in rivista

paper: MICROELECTRONICS RELIABILITY (ATTUALE: Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010 PRECEDENTE: Pergamon Press., Oxford) pp. 1446-1449 - issn: 0026-2714 - wos: WOS:000364256400034 (5) - scopus: 2-s2.0-84943454622 (6)

11573/846322 - 2015 - A thorough investigation of the progressive reset dynamics in HfO2-based resistive switching structures

Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda; Suñé, J.; Miranda, E. - 01a Articolo in rivista

paper: APPLIED PHYSICS LETTERS (New York: American Institute of Physics) pp. 113507- - issn: 0003-6951 - wos: WOS:000361639200056 (8) - scopus: 2-s2.0-84941985566 (7)

11573/963839 - 2015 - Smart sensors for the recognition of specific human motion disorders in Parkinson's disease

Lorenzi, Paolo; Rao, Rosario; Romano, G.; Kita, Ardian; Serpa, M.; Filesi, F.; Irrera, Fernanda; Bologna, Matteo; Suppa, Antonio; Berardelli, Alfredo - 04b Atto di convegno in volume

conference: 2015 6th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2015 (Gallipoli; Italy)

book: Proceedings - 2015 6th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2015 - (9781479989805)

11573/846938 - 2015 - Model of reversible breakdown in HfO2 based on fractal patterns

Lorenzi, Paolo; Rao, Rosario; Romano, Giulio; Irrera, Fernanda - 01a Articolo in rivista

paper: ADVANCES IN CONDENSED MATTER PHYSICS (Cairo: Hindawi Publishing Corporation) pp. 1-8 - issn: 1687-8108 - wos: WOS:000349113200001 (1) - scopus: 2-s2.0-84922342209 (2)

11573/854489 - 2015 - Smart sensing systems for the detection of human motion disorders

Lorenzi, Paolo; Rao, Rosario; Romano, Giulio; Kita, Ardian; Serpa, M; Filesi, F; Parisi, R; Suppa, Antonio; Bologna, Matteo; Berardelli, Alfredo; Irrera, Fernanda - 01a Articolo in rivista

paper: PROCEDIA ENGINEERING (Amsterdam : Elsevier) pp. 324-327 - issn: 1877-7058 - wos: WOS:000380499300073 (15) - scopus: 2-s2.0-84985038542 (15)

11573/936661 - 2015 - Memristor based neuromorphic circuit for visual pattern recognition

Lorenzi, Paolo; Sucre, V.; Romano, Giulio; Rao, Rosario; Irrera, Fernanda - 04b Atto di convegno in volume

conference: International Conference on Memristive Systems, MEMRISYS 2015 (Paphos; Cyprus)

book: 2015 International Conference on Memristive Systems, MEMRISYS 2015 - (9781467392099)

11573/620380 - 2014 - Advanced methodology for electrical characterization of metal/high-k interfaces

Rao, Rosario; Lorenzi, Paolo; Irrera, Fernanda - 01a Articolo in rivista

paper: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B (Slack Incorporated:6900 Grove Road:Thorofare, NJ 08086:(800)257-8290, (856)848-1000, EMAIL: customerservice@slackinc.com, INTERNET: http://www.slackinc.com, Fax: (856)853-5991) pp. 03D120- - issn: 1071-1023 - wos: WOS:000337061900020 (1) - scopus: 2-s2.0-84921999476 (1)

11573/514613 - 2013 - Forming kinetics in HfO2-Based RRAM cells

Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 438-443 - issn: 0018-9383 - wos: WOS:000316816200065 (34) - scopus: 2-s2.0-84871762848 (41)

11573/531062 - 2013 - Impact of the forming conditions and electrode metals on read disturb in HfO2-based RRAM

Lorenzi, Paolo; Rao, Rosario; T., Prifti; Irrera, Fernanda - 01a Articolo in rivista

paper: MICROELECTRONICS RELIABILITY (ATTUALE: Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010 PRECEDENTE: Pergamon Press., Oxford) pp. 1203-1207 - issn: 0026-2714 - wos: WOS:000328588000008 (11) - scopus: 2-s2.0-84988350380 (12)

11573/507181 - 2013 - Electrical instability in LaLuO3 based metal-oxide-semiconductor capacitors and role of the metal electrodes

Rao, Rosario; Irrera, Fernanda - 01a Articolo in rivista

paper: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B (Slack Incorporated:6900 Grove Road:Thorofare, NJ 08086:(800)257-8290, (856)848-1000, EMAIL: customerservice@slackinc.com, INTERNET: http://www.slackinc.com, Fax: (856)853-5991) pp. 01A116- - issn: 1071-1023 - wos: WOS:000313672600016 (2) - scopus: 2-s2.0-84907421494 (2)

11573/530674 - 2013 - Editorial of the Special Issue of Microelectronics Journal on the IEEE International MOS-AK/GSA Workshop on Compact Modeling 2010 (MOS-AK/GSA Rome 2010)

Wladek, Grabinski; Irrera, Fernanda; Balucani, Marco; Nenzi, Paolo - 01a Articolo in rivista

paper: MICROELECTRONICS JOURNAL (Elsevier Advanced Technology:P O Box 150, Kidlington OX5 1AS United Kingdom:011 44 1865 843687, 011 44 1865 843699, EMAIL: eatsales@elsevier.co.uk, INTERNET: http://www.elsevier.com, Fax: 011 44 1865 843971) pp. 1-2 - issn: 0959-8324 - wos: WOS:000315061000001 (0) - scopus: 2-s2.0-84871920747 (0)

11573/441858 - 2012 - Impact of forming pulse geometry and area scaling on forming kinetics and stability of the low resistance state in HfO2-based RRAM cells

Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda - 04b Atto di convegno in volume

conference: 4th IEEE International Memory Workshop (IMW) (Milano; Italy)

book: Proc. 4th IEEE International Memory Workshop (IMW) - (9781467310796; 9781467310802; 9781467310819)

11573/467935 - 2012 - Structural and electrical properties of atomic layer deposited Al-doped ZrO 2 films and of the interface with TaN electrode

S., Spiga; Rao, Rosario; L., Lamagna; C., Wiemer; G., Congedo; A., Lamperti; A., Molle; M., Fanciulli; Palma, Fabrizio; Irrera, Fernanda - 01a Articolo in rivista

paper: JOURNAL OF APPLIED PHYSICS (American Institute of Physics:2 Huntington Quadrangle, Suite 1NO1:Melville, NY 11747:(800)344-6902, (631)576-2287, EMAIL: subs@aip.org, INTERNET: http://www.aip.org, Fax: (516)349-9704) pp. 014107- - issn: 0021-8979 - wos: WOS:000306513400102 (21) - scopus: 2-s2.0-84864141088 (21)

11573/439331 - 2011 - Experimental and Theoretical Study of Electrode Effects in HfO2 based RRAM

C., Cagli; J., Buckley; V., Jousseaume; T., Cabout; A., Salaun; H., Grampeix; J. F., Nodin; H., Feldis; A., Persico; J., Cluzel; Lorenzi, Paolo; L., Massari; Rao, Rosario; Irrera, Fernanda; F., Aussenac; C., Carabasse; M., Coue; P., Calka; E., Martinez; L., Perniola; P., Blaise; Z., Fang; Y. H., Yu; G., Ghibaudo; D., Deleruyelle; M., Bocquet; C., Muller; A., Padovani; O., Pirrotta; L., Vandelli; L., Larcher; G., Reimbold; B., De Salvo - 04b Atto di convegno in volume

conference: 2011 IEEE International Electron Devices Meeting (IEDM) (Washington, DC, USA)

book: 2011 International Electron Devices Meeting - (9781457705045; 9781457705052; 9781457705069)

11573/184157 - 2011 - INTEGRAZIONE IN TECNOLOGIA CMOS ULTRASCALATA

Irrera, Fernanda - 03a Saggio, Trattato Scientifico

11573/406675 - 2011 - L'UNIVERSO DEI NUMERI, I NUMERI DELL'UNIVERSO

Irrera, Fernanda - 02c Prefazione/Postfazione

book: L'UNIVERSO DEI NUMERI, I NUMERI DELL'UNIVERSO - ()

11573/406541 - 2011 - Nanometric Resistive Memories for the next technology node

Lorenzi, Paolo; Rao, Rosario; Irrera, Fernanda; J., Buckley; C., Cagli; B., De Salvo - 04d Abstract in atti di convegno

conference: NANOTECHITALY (VENICE)

11573/377935 - 2011 - Trapping in GdSiO high-k films

Rao, Rosario; R., Simoncini; H. D. B., Gottlob; M., Schmidt; Irrera, Fernanda - 01a Articolo in rivista

paper: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B (Slack Incorporated:6900 Grove Road:Thorofare, NJ 08086:(800)257-8290, (856)848-1000, EMAIL: customerservice@slackinc.com, INTERNET: http://www.slackinc.com, Fax: (856)853-5991) pp. 01A9021-01A9024 - issn: 1071-1023 - wos: WOS:000286679400058 (7) - scopus: 2-s2.0-84988353494 (7)

11573/326206 - 2010 - Advanced Characterization of Metal/High-k Interface

Irrera, Fernanda; Lorenzi, Paolo; Rao, Rosario; R., Simoncini; G., Ghidini; H. D. B., Gottlob; M., Schmidt - 04a Atto di comunicazione a congresso

conference: ULTIMATE SCALING ON SILICON (GLASGOW)

book: International Conference on Ultimate Integration of Silicon, ULIS. - ()

11573/230411 - 2010 - Stress-Induced Via Voiding in a 130-nm CMOS Imager Process

Omar Al, Qweider; Fabio, Grisanti; Nascetti, Augusto; Felice, Russo; Massimo, Sena; Irrera, Fernanda - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 100-107 - issn: 1530-4388 - wos: WOS:000275300600015 (0) - scopus: 2-s2.0-77949356504 (0)

11573/361428 - 2010 - Detrapping dynamics in Al2O3 metal-oxide-semiconductor

Rao, Rosario; Irrera, Fernanda - 01a Articolo in rivista

paper: JOURNAL OF APPLIED PHYSICS (American Institute of Physics:2 Huntington Quadrangle, Suite 1NO1:Melville, NY 11747:(800)344-6902, (631)576-2287, EMAIL: subs@aip.org, INTERNET: http://www.aip.org, Fax: (516)349-9704) pp. 103708-1-103708-6 - issn: 0021-8979 - wos: WOS:000278182400074 (14) - scopus: 2-s2.0-77952990464 (13)

11573/406687 - 2010 - threshold voltage instability in high-k based flash memory

Rao, Rosario; Irrera, Fernanda - 04d Abstract in atti di convegno

conference: European Symposium on REliability and Failure physics and analysis (Cassino)

11573/408189 - 2010 - Threshold voltage instability in high-k based flash memories

Rao, Rosario; Irrera, Fernanda - 04c Atto di convegno in rivista

paper: MICROELECTRONICS RELIABILITY (ATTUALE: Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010 PRECEDENTE: Pergamon Press., Oxford) pp. 1273-1277 - issn: 0026-2714 - wos: WOS:000282607400017 (6) - scopus: 2-s2.0-84988430947 (7)

conference: 21st European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis (ESREF) (Gaeta, ITALY)

11573/362189 - 2010 - Electron-Related Phenomena at the TaN/Al2O3 Interface

Rao, Rosario; Lorenzi, Paolo; G., Ghidini; Palma, Fabrizio; Irrera, Fernanda - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 637-643 - issn: 0018-9383 - wos: WOS:000274993100014 (11) - scopus: 2-s2.0-77649186886 (12)

11573/74672 - 2010 - Trapping in high-k dielectrics

Rao, Rosario; Riccardo, Simoncini; Irrera, Fernanda - 01a Articolo in rivista

paper: APPLIED PHYSICS LETTERS (New York: American Institute of Physics) pp. 163502-163502-3 - issn: 0003-6951 - wos: WOS:000283502100078 (5) - scopus: 2-s2.0-77958476112 (6)

11573/76393 - 2009 - PREDICTION OF BREAKDOWN IN ULTRA-THIN SIO2 FILMS WITH FRACTAL DISTRIBUTION OF TRAPS

F., Russo; G., Badolato; Irrera, Fernanda - 01a Articolo in rivista

paper: JOURNAL OF APPLIED PHYSICS (American Institute of Physics:2 Huntington Quadrangle, Suite 1NO1:Melville, NY 11747:(800)344-6902, (631)576-2287, EMAIL: subs@aip.org, INTERNET: http://www.aip.org, Fax: (516)349-9704) pp. 063708-1-063708-4 - issn: 0021-8979 - wos: WOS:000270378100075 (2) - scopus: 2-s2.0-70349643215 (2)

11573/74446 - 2009 - Reliability Improvements in 50 nm MLC NAND Flash Memory Using Short Voltage Programming Pulses

Irrera, Fernanda; I., Piccoli; Puzzilli, Giuseppina; M., Rossini; T., Vali - 01a Articolo in rivista

paper: MICROELECTRONICS RELIABILITY (ATTUALE: Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010 PRECEDENTE: Pergamon Press., Oxford) pp. 135-138 - issn: 0026-2714 - wos: WOS:000264270800005 (2) - scopus: 2-s2.0-59349087260 (2)

11573/76392 - 2009 - Low-k dielectrics for trench isolation in nanoscaled CMOS imagers Journal of Vacuum Science Technology B, 27 (1) 2009

Irrera, Fernanda; Puzzilli, Giuseppina; L., Ricci; F., Russo; F., Stirpe - 01a Articolo in rivista

paper: JOURNAL OF VACUUM SCIENCE & TECHNOLOGY. B (Slack Incorporated:6900 Grove Road:Thorofare, NJ 08086:(800)257-8290, (856)848-1000, EMAIL: customerservice@slackinc.com, INTERNET: http://www.slackinc.com, Fax: (856)853-5991) pp. 517-520 - issn: 1071-1023 - wos: WOS:000265839000103 (2) - scopus: 2-s2.0-59949103042 (2)

11573/407877 - 2009 - Charge Trapping Nanoelectronic Memories

Lorenzi, Paolo; Rao, Rosario; Palma, Fabrizio; G., Ghidini; Irrera, Fernanda - 01a Articolo in rivista

conference: IEEE-NANOTECHNOLOGY (GENOVA)

11573/625991 - 2009 - Charge trapping NonVolatile Memory

Lorenzi, Paolo; Rao, Rosario; Palma, Fabrizio; G., Ghidini; Irrera, Fernanda - 01a Articolo in rivista

paper: ECS TRANSACTIONS (Pennington, N.J. : The Electrochemical Society) pp. - - issn: 1938-5862 - wos: WOS:000338102400026 (1) - scopus: 2-s2.0-84988429367 (1)

conference: IEEE ELECTROCHEMICAL SOCIETY ULTRA LARGE SCALE INTEGRATION (WIEN)

11573/360932 - 2009 - Fast detrapping transients in high-k dielectric films

Rao, Rosario; Irrera, Fernanda - 01a Articolo in rivista

paper: ECS TRANSACTIONS (Pennington, N.J. : The Electrochemical Society) pp. 259-268 - issn: 1938-5862 - wos: WOS:000338102400025 (0) - scopus: 2-s2.0-84988336109 (0)

conference: ULSI Process Integration 6 - 216th Meeting of the Electrochemical Society (Vienna)

11573/406529 - 2009 - Fast Detrapping Transients in High-k Films

Rao, Rosario; Irrera, Fernanda - 04d Abstract in atti di convegno

conference: IEEE ELECTROCHEMICAL SOCIETY ULTRA LARGE SCALE INTEGRATION (WIEN)

11573/406553 - 2008 - Low-k dielectrics for STI in nanoscaled CMOS imagers

Irrera, Fernanda; Puzzilli, Giuseppina; L., Ricci; F., Russo; F., Stirpe - 04d Abstract in atti di convegno

conference: WORKSHOP ON DIELECTRICS IN MICROELECTRONICS (BERLIN)

11573/74444 - 2008 - T-shaped shallow trench isolation with an unfilled floating void

Irrera, Fernanda; Puzzilli, Giuseppina; L., Ricci; F., Russo; F., Stirpe - 01a Articolo in rivista

paper: SOLID-STATE ELECTRONICS (Oxford: Pergamon, 1960-) pp. 1188-1192 - issn: 0038-1101 - wos: WOS:000259130700012 (0) - scopus: 2-s2.0-48549093824 (0)

11573/406535 - 2008 - On the RESET-SET transition in phase change memories

Puzzilli, Giuseppina; Irrera, Fernanda; Andrea, Padovani; Paolo, Pavan; Luca, Larcher; Ankur, Arya; Vincenzo Della, Marca; Agostino, Pirovano - 04b Atto di convegno in volume

conference: ESSDERC 2008 - 38th European Solid-State Device Research Conference (Edinburgh; Scotland)

book: ESSDERC 2008 - Proceedings of the 38th European Solid-State Device Research Conference - (9781424423637; 9781424423644)

11573/76390 - 2007 - Impact of pulsed operation on performance and reliability of flash memories

Andrea, Chimenton; Irrera, Fernanda; Piero, Olivo - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 1454-1458 - issn: 0018-9383 - wos: WOS:000246929200024 (3) - scopus: 2-s2.0-34249913949 (4)

11573/76389 - 2007 - Characterization of charge trapping in SiO2/Al2O3 dielectric stacks by pulsed C-V technique

Puzzilli, Giuseppina; Govoreanu, B; Irrera, Fernanda; Rosmeulen, M; Van Houdt, J. - 01a Articolo in rivista

paper: MICROELECTRONICS RELIABILITY (ATTUALE: Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010 PRECEDENTE: Pergamon Press., Oxford) pp. 508-512 - issn: 0026-2714 - wos: WOS:000248663300007 (33) - scopus: 2-s2.0-34247119697 (35)

11573/407939 - 2007 - Long time transient in hafnium oxide

Puzzilli, Giuseppina; Irrera, Fernanda - 04d Abstract in atti di convegno

conference: Insulating Films on Semiconductors (ATHENS)

11573/76391 - 2007 - Long time transients in hafnium oxide

Puzzilli, Giuseppina; Irrera, Fernanda - 01a Articolo in rivista

paper: MICROELECTRONIC ENGINEERING (Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598) pp. 2394-2397 - issn: 0167-9317 - wos: WOS:000247378600130 (4) - scopus: 2-s2.0-34249107753 (5)

conference: 15th Biennial Conference on Insulating Films on Semiconductors (Glyfada Athens, GREECE)

11573/406696 - 2006 - improving performance and reliability of NOR-Flash arrays by using pulsed operation

A., Chimenton A; Irrera, Fernanda; P., Olivo - 04d Abstract in atti di convegno

conference: European Symposium on REliability and Failure physics and analysis (WUPPERTAL)

11573/408230 - 2006 - Ultra-Short Pulses Improving Performance and Reliability in Flash memories2006 21st IEEE Non-Volatile Semiconductor Memory Workshop

A., Chimenton; Irrera, Fernanda; P., Olivo - 04b Atto di convegno in volume

book: 2006 21st IEEE Non-Volatile Semiconductor Memory Workshop - (9781424400270)

11573/408146 - 2006 - Towards a viable high-k interpoly dielectric for aggressively scaled floating-gate Flash memory

B., Govoreanu; D., Brunco; L., Haspeslagh; J., De Vos; D., Ruiz Aguado; P., Blomme; Puzzilli, Giuseppina; K., Van Der Zanden; Irrera, Fernanda; J., Van Houdt - 04b Atto di convegno in volume

conference: MATERIAL RESEARCH SYMPOSIUM (SAN FRANCISCO)

11573/76388 - 2006 - Improving performance and reliability of NOR-Flash arrays by using pulsed operation

Chimenton, A; Irrera, Fernanda; Olivo, P. - 01a Articolo in rivista

paper: MICROELECTRONICS RELIABILITY (ATTUALE: Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010 PRECEDENTE: Pergamon Press., Oxford) pp. 1478-1481 - issn: 0026-2714 - wos: WOS:000240776100012 (1) - scopus: 2-s2.0-33747748116 (3)

11573/76387 - 2006 - ENGINEERED BARRIERS WITH HAFNIUM OXIDE FOR NON-VOLATILE APPLICATIONS

Irrera, Fernanda - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 2418-2422 - issn: 0018-9383 - wos: WOS:000240076500057 (7) - scopus: 2-s2.0-33847369104 (6)

11573/408015 - 2006 - Characterisation of charge trapping in SiO2/Al2O3 dielectric stacks by pulsed C-V

Puzzilli, Giuseppina; B., Govoreanu; Irrera, Fernanda; M., Rosmeulen; J., Van Houdt - 04d Abstract in atti di convegno

conference: Workshop on Dielectrics in Microelectronics (ACIREALE (CATANIA))

11573/408163 - 2006 - Transient Behavior Of Hafnium Oxide

Puzzilli, Giuseppina; F., Rori; D., Valli; Irrera, Fernanda - 04d Abstract in atti di convegno

conference: Ultimate Integration on Silicon (GRENOBLE)

11573/365065 - 2006 - Data retention of silicon nanocrystal storage nodes programmed with short voltage pulses

Puzzilli, Giuseppina; Irrera, Fernanda - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 775-781 - issn: 0018-9383 - wos: WOS:000236473500027 (15) - scopus: 2-s2.0-33645730094 (15)

11573/365910 - 2005 - A comprehensive model of oxide degradation

Irrera, Fernanda; Caputo, Domenico; Puzzilli, Giuseppina - 01a Articolo in rivista

paper: MICROELECTRONICS RELIABILITY (ATTUALE: Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010 PRECEDENTE: Pergamon Press., Oxford) pp. 853-856 - issn: 0026-2714 - wos: WOS:000227914200021 (2) - scopus: 2-s2.0-84988419004 (2)

book: Workshop on Dielectrics in Microelectronics (WoDIM) - ()

11573/362707 - 2005 - Crested barrier in the tunnel stack of non-volatile memories

Irrera, Fernanda; Puzzilli, Giuseppina - 01a Articolo in rivista

paper: MICROELECTRONICS RELIABILITY (ATTUALE: Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010 PRECEDENTE: Pergamon Press., Oxford) pp. 907-910 - issn: 0026-2714 - wos: WOS:000227914200034 (3) - scopus: 2-s2.0-84988378133 (2)

book: Microelectronics and Reliability - ()

11573/408167 - 2005 - A New Reliable P/E Methodology for Fully Fowler-Nordheim Operating Non Volatile Memories

Irrera, Fernanda; Puzzilli, Giuseppina - 04b Atto di convegno in volume

conference: International Conf. on Memory Technology and Device (GIENS (FRANCE))

11573/236910 - 2004 - On the reliability of ZrO2 films for VLSI applications

Caputo, Domenico; Irrera, Fernanda - 01a Articolo in rivista

paper: MICROELECTRONICS RELIABILITY (ATTUALE: Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010 PRECEDENTE: Pergamon Press., Oxford) pp. 739-745 - issn: 0026-2714 - wos: WOS:000221250600003 (4) - scopus: 2-s2.0-1842853324 (4)

11573/408177 - 2004 - Tunnel Programming of Non-Volatile Memories

Irrera, Fernanda; B., Riccò - 04d Abstract in atti di convegno

conference: EUROPEAN SOLID STATE DEVICE RESEARCH CONFERENCE (ESTORIL (P))

11573/408181 - 2004 - Crested Barriers In The Tunnel Oxide Stack Of Non-Volatile Memories

Irrera, Fernanda; Caputo, Domenico; Puzzilli, Giuseppina - 04d Abstract in atti di convegno

conference: WORKSHOP ON DIELECTRICS IN MICROELECTRONICS (CORK)

11573/360223 - 2004 - Degradation of ultra-thin oxides

Irrera, Fernanda; Puzzilli, Giuseppina - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 530-534 - issn: 1530-4388 - wos: WOS:000225805000028 (0) - scopus: 2-s2.0-11144228298 (0)

11573/235283 - 2004 - Optimising flash memory tunnel programming

Irrera, Fernanda; Teodoro, Fristachi; Caputo, Domenico; Bruno, Ricco - 01a Articolo in rivista

paper: MICROELECTRONIC ENGINEERING (Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598) pp. 405-410 - issn: 0167-9317 - wos: WOS:000221017500074 (1) - scopus: 2-s2.0-84988431464 (3)

conference: 13th Biennial Conference on Insulating Films on Semiconductors (Barcelona, SPAIN)

11573/210328 - 2004 - Is Pulsed Tunnel Programming suitable for Nanocrystals Floating Gate Memories?

Puzzilli, Giuseppina; Caputo, Domenico; Irrera, Fernanda - 04a Atto di comunicazione a congresso

conference: European Workshop on Ultimate Integration of Silicon (Leuven Belgio)

book: Proceedings of the 5th European Workshop on Ultimate Integration of Silicon - ()

11573/362538 - 2004 - Fast and reliable tunnel programming of nanocrystal nonvolatile memories

Puzzilli, Giuseppina; Caputo, Domenico; Irrera, Fernanda - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 1205-1207 - issn: 0018-9383 - wos: WOS:000222279200027 (4) - scopus: 2-s2.0-4344685973 (6)

11573/365227 - 2004 - Improving floating-gate memory reliability by nanocrystal storage and pulsed tunnel programming

Puzzilli, Giuseppina; Caputo, Domenico; Irrera, Fernanda; Monzio Compagnoni, C; Ielmini, D; Spinelli A., S; Lacaita A., L; Gerardi, C. - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 390-396 - issn: 1530-4388 - wos: WOS:000225805000012 (4) - scopus: 2-s2.0-11144235804 (7)

11573/255411 - 2003 - An advanced characterization of defects in thin oxides

Caputo, Domenico; Irrera, Fernanda; Palma, Fabrizio - 01a Articolo in rivista

paper: MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY (Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598) pp. 94-98 - issn: 0921-5107 - wos: WOS:000185174800020 (0) - scopus: 2-s2.0-0042012776 (1)

conference: Spring Meeting of the European-Materials-Research-Society (E-MRS) (STRASBOURG, FRANCE)

11573/473317 - 2003 - Reliability of ZrO2 films grown by atomic layer deposition

Caputo, Domenico; Irrera, Fernanda; S., Salerno; S., Spiga; M., Fanciulli - 04a Atto di comunicazione a congresso

conference: 4th European Workshop on Ultimate Integration of Silicon (Udine, Italia)

11573/74442 - 2003 - PULSED TUNNEL PROGRAMMING OF NONVOLATILE MEMORIES

Irrera, Fernanda; Ricco, B. - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 2474-2480 - issn: 0018-9383 - wos: WOS:000188004300020 (7) - scopus: 2-s2.0-0346076864 (10)

11573/253045 - 2002 - Investigation and modeling of stressed thermal oxides

Caputo, Domenico; Irrera, Fernanda - 01a Articolo in rivista

paper: MICROELECTRONICS RELIABILITY (ATTUALE: Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010 PRECEDENTE: Pergamon Press., Oxford) pp. 327-333 - issn: 0026-2714 - wos: WOS:000175318700003 (2) - scopus: 2-s2.0-0036497364 (2)

11573/473437 - 2002 - A comprehensive model of defect creation in tunnel oxides

Caputo, Domenico; Irrera, Fernanda - 04a Atto di comunicazione a congresso

conference: 3rd European Workshop on Ultimate Integration of Silicon (Munich (Germania))

11573/248732 - 2002 - MONITORING OF DEFECTS IN THERMAL OXIDES DURING ELECTRICAL STRESS

Caputo, Domenico; Irrera, Fernanda; Palma, Fabrizio - 01a Articolo in rivista

paper: DIFFUSION AND DEFECT DATA, SOLID STATE DATA. PART B, SOLID STATE PHENOMENA (Scitec Publications Limited:Trans Tech House, Hardstrasse 13, CH-4714 Aedermannsdorf Switzerland:Fax: 011 41 62 741058 distributed by TRANS TECH PUBLICATIONS LTD, BRANDRAIN 6, ZURICH-UETIKON, SWITZERLAND, CH-8707) pp. 237-242 - issn: 1012-0394 - wos: WOS:000172421600038 (0) - scopus: 2-s2.0-84988373231 (0)

11573/473388 - 2002 - Effect of pulsed stress on leakage current in mos capacitors for non-volatile memory applications

Caputo, Domenico; R., Feruglio; Irrera, Fernanda; B., Riccò - 04b Atto di convegno in volume

conference: 32nd European Solid-State Device Research (Firenze)

book: Proc. 32nd European Solid-State Device Research - (8890084782)

11573/74441 - 2002 - MICROSCOPIC ASPECTS OF DEFECT GENERATION IN SIO2

Feruglio, R.; Irrera, Fernanda; Ricco', B. - 01a Articolo in rivista

paper: MICROELECTRONICS RELIABILITY (ATTUALE: Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010 PRECEDENTE: Pergamon Press., Oxford) pp. 1427-32 - issn: 0026-2714 - wos: WOS:000178889900034 (2) - scopus: (0)

11573/74439 - 2002 - SILC dynamics in thermal oxides under pulsed stress

Irrera, Fernanda; Ricco', B. - 01a Articolo in rivista

11573/249880 - 2001 - Investigation of defects in deposited oxides with a frequency resolved capacitance technique

Caputo, Domenico; Irrera, Fernanda; Palma, Fabrizio - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 2342-2347 - issn: 0018-9383 - wos: WOS:000171349600024 (5) - scopus: 2-s2.0-0035471794 (5)

11573/473470 - 2001 - A new capacitance technique for characterization of defective oxide

Caputo, Domenico; Irrera, Fernanda; Palma, Fabrizio - 04a Atto di comunicazione a congresso

conference: European Workshop on Ultimate Integration of Silicon (Grenoble)

11573/75882 - 2001 - Degradation kinetics of thermal oxides

Irrera, Fernanda - 01a Articolo in rivista

paper: APPLIED PHYSICS LETTERS (New York: American Institute of Physics) pp. 182-185 - issn: 0003-6951 - wos: WOS:000169659600014 (18) - scopus: 2-s2.0-0035832964 (19)

11573/76352 - 2001 - ELECTRICAL DEGRADATION AND RECOVERY OF DIELECTRICS IN n-POLY-Si/SiOx/SiO2/p-sub STRUCTURES DESIGNED FOR APPLICATION IN LOW-VOLTAGE NON-VOLATILE MEMORIES

Irrera, Fernanda - 01a Articolo in rivista

paper: MICROELECTRONICS RELIABILITY (ATTUALE: Elsevier Science Limited:Oxford Fulfillment Center, PO Box 800, Kidlington Oxford OX5 1DX United Kingdom:011 44 1865 843000, 011 44 1865 843699, EMAIL: asianfo@elsevier.com, tcb@elsevier.co.UK, INTERNET: http://www.elsevier.com, http://www.elsevier.com/locate/shpsa/, Fax: 011 44 1865 843010 PRECEDENTE: Pergamon Press., Oxford) pp. 1809-1813 - issn: 0026-2714 - wos: WOS:000172356800009 (7) - scopus: 2-s2.0-84988432351 (7)

11573/249934 - 2000 - On the Relation between Defect Density and Dopant Concentration in Amorphous Silicon Films

Caputo, Domenico; De Cesare, Giampiero; Irrera, Fernanda; Nascetti, Augusto; Palma, Fabrizio - 01a Articolo in rivista

paper: JOURNAL OF NON-CRYSTALLINE SOLIDS (Amsterdam: Elsevier B.V.) pp. 565-568 - issn: 0022-3093 - wos: WOS:000087189800108 (11) - scopus: 2-s2.0-0345848976 (12)

11573/473492 - 2000 - Simulation and design of amorphous silicon thin-film transistors for driving color detectors

Caputo, Domenico; L., Colalongo; Irrera, Fernanda; Lemmi, Francesco; Palma, Fabrizio - 04a Atto di comunicazione a congresso

conference: Mat. Research Soc. Symp. (San Francisco (USA))

book: Proc. Mat. Research Soc. Symp. - (155899517X)

11573/76350 - 2000 - Transport model in n++-poly/SiOx/SiO2/p-sub MOS capacitors for low-voltage non-volatile memory applications

Irrera, Fernanda; Marangelo, L. - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 372-378 - issn: 0018-9383 - wos: (0) - scopus: 2-s2.0-0033896237 (7)

11573/473548 - 1999 - Effect of material properties in amorphous silicon color detectors

Caputo, Domenico; L., Colalongo; Irrera, Fernanda; Lemmi, Francesco; Palma, Fabrizio; M., Tucci - 04a Atto di comunicazione a congresso

conference: Material Research Society Symposium (San Francisco (USA))

book: Proc. Material Research Society Symposium - (1558994645)

11573/198046 - 1999 - Thin-Film Photodetector for the Ultraviolet and Vacuum Ultraviolet Spectrl Range

De Cesare, Giampiero; Irrera, F; Nicolosi, P. - 04a Atto di comunicazione a congresso

book: Europto: Design and Engineering of Optical System II - ()

11573/789476 - 1999 - Thin-Film Photodetectors for the Ultraviolet and Vacuum Ultraviolet Spectral Range

De Cesare, Giampiero; Irrera, Fernanda; Mazzetta, Massimo; P., Nicolosi - 04b Atto di convegno in volume

conference: 4th Italian Conference on Sensor and Microsystems (Roma, Italy,)

book: SENSORS and MICROSISTEMS - (981-02-4199-2)

11573/75879 - 1999 - Off-Stochiometric silicon oxide for application in low-voltage EEPROM cells

Irrera, Fernanda; Russo, F. - 01a Articolo in rivista

paper: MICROELECTRONIC ENGINEERING (Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598) pp. 423-426 - issn: 0167-9317 - wos: (0) - scopus: 2-s2.0-0033363439 (0)

11573/76351 - 1999 - Enhanced injection in n++-poly/SiOx/SiO2/p-sub MOS capacitors for low-voltage non-volatile memory applications. Experiment

Irrera, Fernanda; Russo, F. - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 2315-2322 - issn: 0018-9383 - wos: (0) - scopus: 2-s2.0-0033317034 (11)

11573/245309 - 1998 - Metastability effect in solar blind UV amorphous silicon carbide photodetector

Caputo, Domenico; De Cesare, Giampiero; Irrera, Fernanda; M., Tucci - 01a Articolo in rivista

paper: JOURNAL OF NON-CRYSTALLINE SOLIDS (Amsterdam: Elsevier B.V.) pp. 1316-1320 - issn: 0022-3093 - wos: WOS:000074599000134 (9) - scopus: 2-s2.0-0032068208 (10)

conference: 17th International Conference on Amorphous and Microcrystalline Semiconductors - Science and Technology (ICAMS 17) (BUDAPEST, HUNGARY)

11573/473567 - 1998 - A Unified Equilibrium Model in Hydrogenated Amorphous Silicon

Caputo, Domenico; G., Cinque; De Cesare, Giampiero; Irrera, Fernanda; Palma, Fabrizio - 04a Atto di comunicazione a congresso

conference: 2nd World Conference on Photovoltaic Solar Energy ()

11573/76382 - 1998 - Driving of a-Si:H adjustable theshold color detectors for video applications

Irrera, Fernanda; Lemmi, F.; Palma, Fabrizio - 01a Articolo in rivista

paper: JOURNAL OF NON-CRYSTALLINE SOLIDS (Amsterdam: Elsevier B.V.) pp. 227-230 - issn: 0022-3093 - wos: (0) - scopus: (0)

11573/473611 - 1997 - Extensive Study of Textured P-Type C-Si/N-Type a-Si:H Heterojunction for Solar Cell Applications

Caputo, Domenico; De Cesare, Giampiero; Irrera, Fernanda; Lemmi, Francesco; Palma, Fabrizio - 04a Atto di comunicazione a congresso

conference: 14th E. C. Photovoltaic Solar Energy (Barcellona)

11573/473620 - 1997 - Current Induced Annealing in Amorphous Silicon Solar Cell

Caputo, Domenico; De Cesare, Giampiero; Irrera, Fernanda; Lemmi, Francesco; Palma, Fabrizio; M., Tucci - 04a Atto di comunicazione a congresso

conference: 14th E. C. Photovoltaic Solar Energy (Barcellona)

11573/473650 - 1997 - Defect Evolution During a-Si:H Solar Cell Degradation

Caputo, Domenico; De Cesare, Giampiero; Irrera, Fernanda; Lemmi, Francesco; Palma, Fabrizio; M., Tucci - 04a Atto di comunicazione a congresso

conference: 14th E. C. Photovoltaic Solar Energy (Barcellona)

11573/245114 - 1997 - Thin-film photodetectors for the vacuum ultraviolet spectral region

De Cesare, Giampiero; Irrera, Fernanda; Palma, Fabrizio; Naletto, G.; Nicolosi, P.; Jannitti, E. - 01a Articolo in rivista

paper: APPLIED OPTICS (-Washington, DC: Optical Society of America -Easton, Pa. : Optical Society of America, c1962?]-c1989.) pp. 2751-2754 - issn: 0003-6935 - wos: WOS:A1997WX24200001 (5) - scopus: 2-s2.0-0031145835 (5)

11573/145453 - 1997 - Amorphous silicon thin film as tunable and high sensitive photodetector in UV and far UV spectral range

De Cesare, Giampiero; Irrera, Fernanda; Palma, Fabrizio; Nascetti, Augusto; Naletto, G; Nicolosi, P. - 01a Articolo in rivista

paper: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT (Elsevier BV:PO Box 211, 1000 AE Amsterdam Netherlands:011 31 20 4853757, 011 31 20 4853642, 011 31 20 4853641, EMAIL: nlinfo-f@elsevier.nl, INTERNET: http://www.elsevier.nl, Fax: 011 31 20 4853598) pp. 243-245 - issn: 0168-9002 - wos: WOS:A1997WV27800052 (4) - scopus: 2-s2.0-0031102667 (5)

11573/790151 - 1997 - Amorphous/crystalline silicon two terminal visible/infrared tunable photodetector: modeling and realization

De Cesare, Giampiero; Irrera, Fernanda; Tucci, M. - 04b Atto di convegno in volume

conference: Proceedings of the 1997 MRS Spring Symposium (San Francisco, CA, USA, null)

book: Materials Research Society Symposium - Proceedings - (1-55899-371-1)

11573/256563 - 1997 - TRANSIENT BEHAVIOUR OF ADJUSTABLE THRESHOLD THREE-COLOR DETECTORS

Irrera, Fernanda; Lemmi, F.; Palma, Fabrizio - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 1410-1416 - issn: 0018-9383 - wos: (0) - scopus: (0)

11573/257097 - 1996 - Solar blind UV photodetectors for large area applications

Caputo, Domenico; De Cesare, Giampiero; Irrera, Fernanda; Palma, Fabrizio - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 1351-1356 - issn: 0018-9383 - wos: WOS:A1996VF57500005 (58) - scopus: 2-s2.0-0030243117 (63)

11573/470608 - 1996 - Amorphous silicon optical spectrum analyzer for the visible range

Caputo, Domenico; Irrera, Fernanda; Palma, Fabrizio; Rachele, S.; Tucci, M. - 01a Articolo in rivista

paper: JOURNAL OF NON-CRYSTALLINE SOLIDS (Amsterdam: Elsevier B.V.) pp. 1172-1175 - issn: 0022-3093 - wos: (0) - scopus: 2-s2.0-0030563562 (5)

11573/671841 - 1996 - Variable Spectral Response Photodetector Based on Crystalline/Amorphous Silicon Heterostructure

De Cesare, Giampiero; F., Galluzzi; Irrera, Fernanda; D., Lauta; F., Ferrazza; M., Tucci - 01a Articolo in rivista

paper: JOURNAL OF NON-CRYSTALLINE SOLIDS (Amsterdam: Elsevier B.V.) pp. 1189-1192 - issn: 0022-3093 - wos: WOS:A1996UX34500137 (6) - scopus: 2-s2.0-9344262261 (7)

11573/470615 - 1996 - Amorphous silicon UV photodetectors with rejection of the visible spectrum

De Cesare, Giampiero; Iorio, V.; Irrera, Fernanda; Palma, Fabrizio; Tucci, M. - 01a Articolo in rivista

paper: JOURNAL OF NON-CRYSTALLINE SOLIDS (Amsterdam: Elsevier B.V.) pp. 1198-1201 - issn: 0022-3093 - wos: (0) - scopus: 2-s2.0-0030563553 (9)

11573/790265 - 1996 - Amorphous silicon thin film photodetectors with high sensitivity and selectivity in the ultraviolet spectrum

Naletto, Giampiero; Nicolosi, Piergiorgio; Pace, Emanuele; De Cesare, Giampiero; Irrera, Fernanda; Palma, Fabrizio - 04b Atto di convegno in volume

conference: EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII (Denver, CO, usa)

book: Proceedings of SPIE - The International Society for Optical Engineering - (9780819421968; 9780819421968)

11573/470624 - 1995 - Bias Controlled Amorphous Si/SiC:H Photodetector

Caputo, Domenico; De Cesare, Giampiero; Irrera, Fernanda; Lemmi, F.; Masini, G.; Palma, Fabrizio; Tucci, M. - 01a Articolo in rivista

11573/14431 - 1995 - Tunable photodetector based on amorphous Si/SiC heterostructure

De Cesare, Giampiero; Irrera, Fernanda; Lemmi, Francesco; Palma, Fabrizio - 01a Articolo in rivista

paper: IEEE TRANSACTIONS ON ELECTRON DEVICES (IEEE / Institute of Electrical and Electronics Engineers Incorporated:445 Hoes Lane:Piscataway, NJ 08854:(800)701-4333, (732)981-0060, EMAIL: subscription-service@ieee.org, INTERNET: http://www.ieee.org, Fax: (732)981-9667) pp. 835-840 - issn: 0018-9383 - wos: WOS:A1995QU42700007 (36) - scopus: 2-s2.0-0029306019 (39)

11573/674449 - 1995 - Amorphous Silicon/Silicon Carbide Photodetectors With Excellent Sensitivity and Selectivity in the Vacuum Ultraviolet Spectrum

De Cesare, Giampiero; Irrera, Fernanda; Palma, Fabrizio; M., Tucci; G., Naletto; P., Nicolosi; E., Jannitti - 01a Articolo in rivista

paper: APPLIED PHYSICS LETTERS (New York: American Institute of Physics) pp. 335-337 - issn: 0003-6951 - wos: WOS:A1995RK39600013 (24) - scopus: 2-s2.0-0029345963 (33)

11573/470661 - 1994 - A systematic investigation of the role of material parameters in metastability of hydrogenated amorphous silicon

Caputo, Domenico; De Cesare, Giampiero; Irrera, Fernanda; Palma, Fabrizio; Rossi, M. C.; Conte, G.; Nobile, G.; Fameli, G. - 01a Articolo in rivista

paper: JOURNAL OF NON-CRYSTALLINE SOLIDS (Amsterdam: Elsevier B.V.) pp. 278-286 - issn: 0022-3093 - wos: (0) - scopus: 2-s2.0-0028466918 (16)

11573/470688 - 1994 - Characterization of intrinsic a-Si:H in p-i-n devices by capacitance measurements: Theory and experiments

Caputo, Domenico; De Cesare, Giampiero; Irrera, Fernanda; Palma, Fabrizio; Tucci, M. - 01a Articolo in rivista

paper: JOURNAL OF APPLIED PHYSICS (American Institute of Physics:2 Huntington Quadrangle, Suite 1NO1:Melville, NY 11747:(800)344-6902, (631)576-2287, EMAIL: subs@aip.org, INTERNET: http://www.aip.org, Fax: (516)349-9704) pp. 3534-3541 - issn: 0021-8979 - wos: (0) - scopus: 2-s2.0-0000578490 (23)

11573/470685 - 1994 - Monitoring of Photodegradation and Recovery of a-Si:H p-i-n Solar Cells by Capacitance Measurements

Caputo, Domenico; Irrera, Fernanda; Palma, Fabrizio; Tucci, M. - 01a Articolo in rivista

paper: PHYSICA SCRIPTA (Royal Swedish Academy of Sciences:Publications Department, Box 50005, S-104 05 Stockholm Sweden:011 46 8 1664480, INTERNET: http://www.kva.se/eng/index.html, Fax: 011 46 8 166405, 011 46 8 6739590) pp. 724-729 - issn: 0031-8949 - wos: (0) - scopus: 2-s2.0-0028442929 (1)

11573/470635 - 1994 - Amorphous Si/SiC three-color detector with adjustable threshold

De Cesare, Giampiero; Irrera, Fernanda; Lemmi, F.; Palma, Fabrizio - 01a Articolo in rivista

paper: APPLIED PHYSICS LETTERS (Melville, NY : American Institute of Physics) pp. 1178-1180 - issn: 1077-3118 - wos: (0) - scopus: (0)

11573/467851 - 1993 - A CORRELATION STUDY BETWEEN PHOTODEGRADATION AND MATERIAL QUALITY IN AMORPHOUS-SILICON P-I-N SOLAR-CELLS

Bolognesi, G; Irrera, Fernanda; Palma, Fabrizio - 04a Atto di comunicazione a congresso

conference: 23rd IEEE Photovoltaic Specialists (LOUISVILLE, KY)

book: Conference Record of the Twenty Third IEEE Photovoltaic Specialists Conference - 1993 (Cat. No.93CH3283-9) - (0780312201)

11573/470671 - 1993 - CPM and spectral photoconductivity techniques: a critical analysis of the experimental results

Conte, G.; Irrera, Fernanda; Nobile, G.; Palma, Fabrizio - 01a Articolo in rivista

paper: JOURNAL OF NON-CRYSTALLINE SOLIDS (Amsterdam: Elsevier B.V.) pp. 419-422 - issn: 0022-3093 - wos: (0) - scopus: 2-s2.0-17144468411 (8)

11573/467856 - 1991 - A new “double carrier” analytical model of carriers transport in p-i-n amorphous silicon solar cells

Irrera, Fernanda; Palma, Fabrizio - 01a Articolo in rivista

paper: SOLID-STATE ELECTRONICS (Oxford: Pergamon, 1960-) pp. 801-808 - issn: 0038-1101 - wos: WOS:A1991FY09400001 (6) - scopus: 2-s2.0-0026205206 (6)

11573/470705 - 1989 - Toward an analytical solution of the hydrogenated amorphous silicon p-i-n structure: Hyperbolic approximation of nonuniform electric field

Irrera, Fernanda; Palma, Fabrizio - 01a Articolo in rivista

paper: JOURNAL OF APPLIED PHYSICS (American Institute of Physics:2 Huntington Quadrangle, Suite 1NO1:Melville, NY 11747:(800)344-6902, (631)576-2287, EMAIL: subs@aip.org, INTERNET: http://www.aip.org, Fax: (516)349-9704) pp. 3661-3665 - issn: 0021-8979 - wos: (0) - scopus: 2-s2.0-36549094102 (3)